Infrared Relectance Standards Survey

Infrared Reflectance Standards Survey
INSTRUCTIONS:

"PRIORITY" pick a priority level from the drop down menu:
1 = high
(a critical parameter; SRM of no value without it)
2 = medium
(important for calibration purposes, but not absolutely essential)
3 = low
(useful, but icing on the cake)
0 = zero
(not important, immaterial)
4 = none
(don't know or no opinion)

PARAMETER

PRIORITY

VALUES

Angle dependent Reflection Standards
1

Wavelength (λ) Range, (µm)

2-14

3-5

8-12

10.6

2

Reflectance Factor (R), 1.00 = 100%

> 0.9

0.2 - 0.7

< 0.1

< 0.02

3

Spectral Characteristic (neutrality)

4

Angle Range(s), °

5

Expanded Uncertainty (k=2), %

6

Standards / Calibration service

7

Spatial Uniformity Requirement

8

Sample Size (mm)/Geometry

9

Spot Size

neutral

w/ structure

near normal only

± 10

lower limit

±5

±2

Standards for purchase

±

% over 90% of surface

25

50

Hemi-ellipsoid

100

Bi-Conical Designs

11 Please indicate what type of instruments are used for a SRM:
FT

Monochromator

Filters

stepsize (interval)

<±1

Calibration Service at NIST

mm

Integrating Sphere

upper limit

±1

10 Please indicate your instrumental application for use of a SRM:
BRDF

-

Circular Variable Filter (CVF)

round

square

Measurement Intercomparison, Round-Robin
other

12 Your participation
13 Time scale: Next comparison
should be within

3 yr.

2 yr.

1 yr.

6 month

EO-IR Workshop (or similar)
14 Usefullness/Attendance

15 Structure of the workshop

attended
in the past
discussion groups

plan to attend
in future
presentations

tutorials

mixture of above

16 Location

17 Timing

Comments

Contact Information:

independent

Spring

Summer

part of or parallel to Conference

Fall

Winter

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National Institute of Standards and Technology, Attn: Leonard Hanssen, hanssen@nist.gov, tel:
301-975-2344.
OMB Control #0693-XXXX. Expiration Date: XX/XX/XXXX